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DTSTAMP:20230124T171524Z
LOCATION:D222
DTSTART;TZID=America/Chicago:20221114T140000
DTEND;TZID=America/Chicago:20221114T142000
UID:submissions.supercomputing.org_SC22_sess443_ws_xloop105@linklings.com
SUMMARY:Testing the Data Framework for an AI Algorithm in Preparation for 
 High Data Rate X-Ray Facilities
DESCRIPTION:Workshop\n\nTesting the Data Framework for an AI Algorithm in 
 Preparation for High Data Rate X-Ray Facilities\n\nChen, Chitturi, Plumley
 \n\nThe advent of next-generation X-ray free electron lasers will be capab
 le of delivering X-rays at a repetition rate approaching 1 MHz continuousl
 y. This will require the development of data systems to handle experiments
  at these type of facilities, especially for high throughput applications,
  such as femtosecond X-ray crystallography and X-ray photon fluctuation sp
 ectroscopy.  Here, we demonstrate a framework which captures single shot X
 -ray data at the LCLS and implements a machine-learning algorithm to autom
 atically extract the contrast parameter from the collected data. We measur
 e the time required to return the results and assess the feasibility of us
 ing this framework at high data volume. We use this experiment to determin
 e the feasibility of solutions for ‘live’ data analysis at the MHz repetit
 ion rate.\n\nSession Format: Recorded\n\nRegistration Category: Workshop R
 eg Pass
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